Monte Carlo Applications for Partially Polarized Inverse External-Compton Scattering (MAPPIES). II. Application to the UV/Soft X-Ray Excess in Blazar Spectra

Abstract The spectral energy distributions (SEDs) of some blazars exhibit an ultraviolet (UV) and/or soft X-ray excess that can be modeled with different radiation mechanisms. Polarization measurements the UV/X-ray emission from may provide new and unique information about astrophysical environment blazar jets, could thus help to distinguish between scenarios. In this paper, a Monte Carlo code—Monte Applications for Partially Polarized Inverse External-Compton Scattering—for polarization-dependent Compton scattering is used simulate polarization signatures in model where UV/soft arises bulk process. Predictions expected SED AO 0235+164 UV 3C 279 are made upcoming proposed polarimetry missions.